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13 New Products in the Detectors for Microscopy Family!«« View All New Products
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Thorlabs offers a variety of detectors designed for imaging systems. PMT detectors allow for additional detection channels in multiphoton or confocal microscopes. A power meter with the same dimensions as a microscope slide makes measuring the power at the sample possible. We also offer a selection of balanced detectors specifically designed for OCT applications.
2.1 Megapixel sCMOS Camera (View Product Family)
1 New Product!
CS2100M-USB
Quantalux™ 2.1 Megapixel Monochrome sCMOS Camera, USB 3.0 Interface
CS2100M-USB- Quantalux™ 2.1 Megapixel Monochrome sCMOS Camera, USB 3.0 Interface RELEASED: October 02, 2017
Response-Flattening Filters for Silicon Photodiodes (View Product Family)
2 New Products!
SRF11
Ø1" Response Flattening Filter for Silicon Photodiodes, 400 - 1100 nm
SRF11- Ø1" Response Flattening Filter for Silicon Photodiodes, 400 - 1100 nm RELEASED: September 11, 2017
SRF15
Ø1/2" Response Flattening Filter for Silicon Photodiodes, 400 - 1100 nm
SRF15- Ø1/2" Response Flattening Filter for Silicon Photodiodes, 400 - 1100 nm RELEASED: September 11, 2017
SM05-Threaded Mounted Photodiodes, Cathode Grounded (View Product Family)
1 New Product!
SM05PD3A
Mounted Silicon Photodiode, 320-1100 nm, Cathode Grounded
SM05PD3A- Mounted Silicon Photodiode, 320-1100 nm, Cathode Grounded RELEASED: August 25, 2017
M2 Measurement System (View Product Family)
2 New Products!
M2MS-BP209IR2/M
M2 Measurement System with BP209-IR/M, 900 - 2700 nm, Metric
M2MS-BP209IR2/M- M2 Measurement System with BP209-IR/M, 900 - 2700 nm, Metric RELEASED: August 21, 2017
M2MS-BP209IR2
M2 Measurement System with BP209-IR/M, 900 - 2700 nm
M2MS-BP209IR2- M2 Measurement System with BP209-IR/M, 900 - 2700 nm RELEASED: August 21, 2017
Scanning Slit Optical Beam Profilers (View Product Family)
2 New Products!
BP209-IR2/M
Dual Scanning Slit Beam Profiler, 900 - 2700 nm, Ø2.5 µm - Ø9 mm, Metric
BP209-IR2/M- Dual Scanning Slit Beam Profiler, 900 - 2700 nm, Ø2.5 µm - Ø9 mm, Metric RELEASED: August 21, 2017
BP209-IR2
Dual Scanning Slit Beam Profiler, 900 - 2700 nm, Ø2.5 µm - Ø9 mm
BP209-IR2- Dual Scanning Slit Beam Profiler, 900 - 2700 nm, Ø2.5 µm - Ø9 mm RELEASED: August 21, 2017
HgCdTe (MCT) Photovoltaic Detector: 2.7 - 5 µm (View Product Family)
1 New Product!
VL5T0
HgCdTe Single-Junction Photovoltaic Detector, 5 µm, 1 mm2 Active Area
VL5T0- HgCdTe Single-Junction Photovoltaic Detector, 5 µm, 1 mm2 Active Area RELEASED: July 31, 2017
HgCdTe (MCT) Photovoltaic Detector: 2.5 - 8.0 µm (View Product Family)
2 New Products!
VML8T0
HgCdTe Multi-Junction Photovoltaic Detector, 8 µm, 1 mm2 Active Area
VML8T0- HgCdTe Multi-Junction Photovoltaic Detector, 8 µm, 1 mm2 Active Area RELEASED: July 31, 2017
VML8T4
HgCdTe Multi-Junction Photovoltaic Detector with TEC, 8 µm, 1 mm2 Active Area
VML8T4- HgCdTe Multi-Junction Photovoltaic Detector with TEC, 8 µm, 1 mm2 Active Area RELEASED: July 31, 2017
HgCdTe (MCT) Photovoltaic Detector: 2.5 - 10.6 µm (View Product Family)
2 New Products!
VML10T0
HgCdTe Multi-Junction Photovoltaic Detector, 10.6 µm, 1 mm2 Active Area
VML10T0- HgCdTe Multi-Junction Photovoltaic Detector, 10.6 µm, 1 mm2 Active Area RELEASED: July 31, 2017
VML10T4
HgCdTe Multi-Junction Photovoltaic Detector with TEC, 10.6 µm, 1 mm2 Active Area
VML10T4- HgCdTe Multi-Junction Photovoltaic Detector with TEC, 10.6 µm, 1 mm2 Active Area RELEASED: July 31, 2017


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